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USB Device Logo Testing Recommended Practices

  • Article

Note  This content applies to the Windows Logo Kit (WLK). For the latest information using the new Windows Hardware Certification Kit (HCK), see Windows HCK User's Guide on the Windows Hardware Dev Center.

Generic USB Tests: Microsoft

  • USB Address Description Test

  • USB Device Control Requests Test

  • USB Enumeration Stress Test

  • USB Descriptor Test

  • USB Selective Suspend

  • USB Serial Number

Generic USB Tests: USB interface (IF) and Intel

  • Command Verifier (CV) Test Suite:

    • USB Device Framework (CV) Test
    • USB HIDView (CV) Test

  • USB Specification Compliance

Connecting a device to a USB 2.0 hub

  • Advantages with this method:
    • Recommended for regular USB devices
    • Required for the USB Selective Suspend test
    • Forces low and full-speed devices to be enumerated by the EHCI (high speed) controller
  • Disadvantages with this method:
    • Devices with embedded hubs must be directly connected for Microsoft tests
    • Multi-TT hubs not recommended for logo testing

Devices with embedded hubs

  • For embedded full-speed hubs:
    • Use an external USB 2.0 hub for the USB Device Framework (CV) Test and USB HIDView (CV) Test
    • Attach the device directly to the system for all other tests
  • For embedded high-speed hubs
    • Attach the device directly to the system for all tests
  • Note: Exposed ports
    • If the hub exposes ports, the embedded hub must separately pass the USB Hub logo program
    • Embedded full-speed hubs are exempt from the USB Hub Basic Transfer Test
    • Change the IsEmbeddedUSBDevice parameter from FALSE to TRUE for the following tests:
      • USB HIDView (CV) Test
      • USB Address Description Test
      • USB Descriptor Test
      • USB Device Control Requests Test
      • USB Device Framework (CV) Test
      • USB Enumeration Stress Test
      • USB Hub Compliance (CV) Test
      • USB Selective Suspend
      • USB Serial Number

Systems with embedded devices

  • For embedded devices that are not attached via a USB hub:
    • The USB Selective Suspend test will always fail
    • The USB Device Framework (CV) Test and the USB HIDView (CV) Test will fail unless the embedded device is a high-speed (USB 2.0) device
  • For embedded devices that are attached downstream of 2 or more hubs:
    • All Microsoft-supplied tests will fail. The USB Device Framework (CV) Test and the USB HIDView (CV) Test will fail unless the device is a high-speed device
  • Solution:
    • Set the IsEmbeddedUSBDevice job parameter to TRUE if and only if your device falls into one of the above categories
    • The IsEmbeddedUSBDevice job parameter is used in the following tests:
      • USB HIDView (CV) Test
      • USB Address Description Test
      • USB Descriptor Test
      • USB Device Control Requests Test
      • USB Device Framework (CV) Test
      • USB Enumeration Stress Test
      • USB Hub Compliance (CV) Test
      • USB Selective Suspend
      • USB Serial Number

For the USB Basic Transfer Test

  • The USB Hub Basic Transfer Test is designed only to evaluate USB 2.0 high-speed hubs (400 Mbps), not full-speed or USB 1.1 hubs (11 Mbps). For full-speed hubs, customer should set the IsEmbeddedFullSpeedHub schedule-time parameter to TRUE in the Device Console when scheduling this test. The parameter lets DTM know that the hub is not a high-speed hub and will therefore exempt the test entirely.

USB Serial Number test

  • The USB Serial Number test runs only if device supports unique serial number

  • The test validates the uniqueness of the serial number

  • The test requires two identical devices to run

  • The devices must be attached before the test is scheduled to run

For the USB Device framework test, the USB HIDView test and the USB Hub compliance test

  • If the test machine has two USB controllers disable the controller that is not under test or the test will fail

 

 

Build date: 9/14/2012